Overlay Metrology Engineer
About this role
About the Role
IBM Research is seeking an Overlay Metrology Engineer to monitor, analyze, and improve overlay measurement performance across Image-Based, SEM-Based, and Diffraction-Based methods. The role combines data analysis, real-time operational support, and collaboration with process, device integration, and lithography teams to deliver robust metrology solutions for next‑generation devices. What You'll Do
- Monitor and analyze overlay KPIs through daily performance readouts and weekly reports, identifying trends, root causes, and improvement opportunities.
- Provide real‑time line support for overlay metrology operations, addressing spec violations, measurement failures, tool behavior issues, and recipe-related constraints.
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